INVITATION | Mega Phase is heading to Vietnam VIMF 2025!

From Micron to Mastery, Mega Phase Makes Vision Inspection Smarter and Faster

We'll be exhibiting at the Vietnam Industrial and Manufacturing Fair (VIMF 2025)—a great event on machinery, equipment, and technology for manufacturing and supporting industry. 

In today's competitive manufacturing landscape, achieving zero defects and maximizing efficiency is paramount. As production speeds increase and precision tolerances tighten, traditional inspection methods face unprecedented challenges. For example, as components in electronics manufacturing become smaller and more densely packed, traditional inspection systems struggle with blind spots or fail con complex, reflective or transparent materials. 

Reliable inspection means consistent, perfect data. At VIMF 2025, we will demonstrate how our industrial 3D cameras and 2.5D Hybrid Data Camera overcome these challenges.

Why visit us: Improve yield rate with industrial cameras on your production line

Don't let microscopic defects erode your profits. Mega Phase’s advanced industrial cameras are engineered for inspecting micro defects and dimensional deviations across semiconductor, electronics, precision manufacturing, and automotive parts lines.

01 FPGA-based Hardware Computational Image, get results in as little as 0.3s

With our proven HWCI technology, the industrial cameras snapshot, process, and output data in parallel. It costs only as little as 0.3s with the 2.5D Hybrid Data Camera and 0.5s with Sizector® to get the image. This makes cameras ideal for inline measurement and inspection, especially for high-throughput production lines of demanding cycle times.

02 Get Data from Multi-channel, Flexible, AI-Ready 3D/2.5D Vision

Modern manufacturing demands complex and varied measurement and inspection. Instead of locking you into one type of data, we provide a flexible, multi-channel output. For example, the 2.5D Hybrid Data Camera can simultaneously output mono 2D, color 2D, phase measuring deflectometry data, and photometric stereo data, allowing you to choose the best “view” for your object, no matter if it is glossy metal, dark material, transparent lens... Over 40 channels are shown in the SDK, like Gray, WinGradient, Nx, Ny, etc., ensuring there is always a channel that makes your defect clearly visible. This flexibility is perfect for AI training, advanced analytics, or direct PLC and robot integration.

03 Robust and reliable, developed for industrial environments

Featuring a small footprint, rugged mechanics, and multiple operation modes, our industrial 3D camera and 2.5D hybrid data camera are built for factory floors and robotics integration, fitting your specific needs.

What you will see: High-precision 3D measurement for fine details and 2.5D inspection camera that makes defects visible

This time, Mega Phase set four demos to show its capability to address challenging measurement and inspection tasks in electronics and semiconductor manufacturing. 

01 Flatness measurement of foldable phone hinge

Model: Sizector®Industrial 3D Camera M051040

+ 5.1 MP global shutter CMOS sensor, get crisp edge against specular reflection or blurry outline

+ Use subpixel edge detection algorithms to ensure best-in-class repeatability for key dimensional measurement

+ Parallel multi-tasking, powered by HWCI, analyze key dimensions across multiple points within 2-5s

02 Pin Height Measurement of Transceiver Module

Model: Sizector®Industrial 3D Camera SQ081017N

+ One-stop 2D+3D measurement

+ HWCI based on FPGA chip, industrial-grade efficiency and multi-tasking

+ Multi-projection, shadow-free measurement, ideal for dense components

+ Larger FOV with leading 16.2 MP resolution and telecentric lens, identify micro-deformation, warpage, coplanarity deviations

03 Surface defect inspection on IC Heat Spreader

Model: DH200

+ Compute surface normals by lighting direction changes, with adaptive multi-spectral partition lighting on brushed aluminum

+ Complete data, strong reflection resistant with patented multi-frame fusion algorithm

+ 0.03s part-to-part inspection interval, based on FPGA parallel architecture and hardware level optoelectronic sync

+ Directly output high-contrast normal/reflectance map based on photometric stereo -- 10 times higher signal-to-noise ratios over traditional 2D vision on brushed metal

04 Surface defect inspection for transparent lens covers

Model: DH 200

+ See both surface scratches and internal defects, transparency and reflection resistant as it compute surface gradient changes by phase demodulation.

+ Unique WinGradientTM actively boosts micro-gradient signals on transparent surfaces, 50 times higher sensitivity over traditional grayscale imaging

+ 0.03s part-to-part inspection interval, based on FPGA parallel architecture and hardware level optoelectronic sync
+ Directly output high-contrast WinGradient (slope map) based on PMD -- 10 times higher signal-to-noise ratio over traditional 2D vision on transparent materials

Pre-register to Meet Mega Phase at VIMF 2025, Book A Meeting Now! 

Again, we cordially invite you to visit our booth 778. Our technical experts will be available for one-on-one consultations to discuss a custom vision solution for your specific needs.