DM Series
Revolutionize defect detection for highly reflective, transparent, translucent parts.
The phase measuring deflectometry mode revolutionizes micro-defect inspection. It overcomes:
1) detail-masking overexposure on highly reflective surfaces, e.g., specular metal, wafers.
2) Contour loss on transparent/translucent materials, e.g., coated glass, optical plastics.
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Phase-Measuring Deflectometry (PMD)
Using this mode achieves nanometer-level defect sensing by calculating phase gradient information (based on PMD) to push the physical pixel resolution limit.
Technical Details
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DM200
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DM162
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DM081
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Resolution (px)
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Image Scale
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CMOS Size
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CMOS Type
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Exposure Type
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Unit Cell Size
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Framerate of whole Cycle*¹
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Light Interface
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Lens Mount
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Dimension (LxWxH)
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Weight
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20M (4512 x 4512)
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1:1
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1.1"
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Monochrome CMOS
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Global Shutter
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2.74μm x 2.74μm
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≤1.6 FPS
≤3.2 FPS(Binning) -
Programmable screen light interface Mini HDMI x 1
Four-channel standard light source interface (3-Pin, camera synchronization exposure, 4 overall current ≤ 6A) -
C-Mount
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138.5mm x 120mm x 52.3mm
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680g
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16.2M (5328 x 3040)
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16:9
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1.1"
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Monochrome CMOS
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Global Shutter
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2.74μm x 2.74μm
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≤1.85 FPS
≤3.3 FPS (Binning) -
Programmable screen light interface Mini HDMI x 1
Four-channel standard light source interface (3-Pin, camera synchronization exposure, 4 overall current ≤ 6A) -
C-Mount
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138.5mm x 120mm x 52.3mm
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680g
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8.1M (2856 x 2848)
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1:1
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2/3"
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Monochrome CMOS
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Global Shutter
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2.74μm x 2.74μm
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≤2 FPS
≤3.5 FPS (Binning) -
Programmable screen light interface Mini HDMI x 1
Four-channel standard light source interface (3-Pin, camera synchronization exposure, 4 overall current ≤ 6A) -
C-Mount
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138.5mm x 120mm x 52.3mm
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680g
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*1. Full field of view (FOV) and full depth of field(DOF) repeatability: Set a ceramic plate as the target. Capture the plate at positive-limit DOF (near limit), zero plane (nominal), and negative-limit DOF (far limit). From each FOV, 9 edge/corner regions are evenly selected for measurement. Record the worst-case value among 27 regional z-axis repeatability*² as the result.
*2. Regional Z-axis Repeatability: The standard deviation (1σ) from 100 measurements of the difference in mean height (Z-value) between two adjacent regions (A and B). Each region covers 1% of the FOV.
Documents
| Types | Name | Language | Updated | Download | File type | |
|---|---|---|---|---|---|---|
| Brochure | Hybrid Data Camera Product Brochure | English | January 7, 2026 | 8.01 MB |
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