Precision vision for semiconductor frontier
In front-end processing and back-end packaging, visual inspection faces a strict engineering standard. Discover how to maintain a stable process while minimizing manual debugging and tuning to its absolute limits.
INDUSTRY
PAIN POINTS
-
High throughput, tight takt time01
Packaging, sorting, and testing equipment demand millisecond-level vision response. Any latency directly leads to throughput loss.
Why usHardware-level parallel computing
Based on Mega Phase hardware computational imaging technology (HWCI) and pixel-level parallel computing by FPGA. Image reconstruction offloads entirely from the host IPC, ensuring deterministic, real-time synchronization
Instantaneous Output
Analysis is completed autonomously within the camera. By outputting high-resolution results directly with millisecond-level feedback, our systems perfectly match the cadence of high-speed sorters and testers. -
Multi-layered and high-eflective materials02
Wafer surfaces, lead frames, and gold wires are extremely reflective. This causes tiny scratches, chipping, or foreign objects to be easily obscured by complex background textures.
Why usHigh Dynamic Range (HDR) imaging
Our adaptive Single-Frame HDR suppresses glare from wire bonds and solder balls while restoring shadow details. This helps accurately identify micron-level defects.
Authentic 3D Reconstruction
Proprietary optical algorithms isolate surface reflection properties. Even when dealing with complex, high-transparency films, our technology extracts authentic 3D point cloud features and textures.
Ultra-high resolution
With up to 20MP CMOS sensors, we achieve 2x2 pixel-level sensitivity for tiny dead-pixel detection, ensuring the highest reliability for wafers and packaged components. -
Compact footprint complicates integration03
Space within semiconductor equipment is extremely constrained. It imposes stringent requirements for component miniaturization and minimal computing occupation.
Why usAll-in-one design
Our highly integrated design combines image acquisition, processing, and lighting control into a single unit. By eliminating bulky external controllers, we significantly reduce the system's physical footprint.
Rapid scalability
Simple physical integration combined with high product consistency drastically shortens equipment debugging and line expansion cycles, lowering overall engineering costs.
LET MEGA PHASE
SOLVE YOUR
CHALLENGES
LET MEGA PHASE
SOLVE YOUR
CHALLENGES
-
Clear vision starts hereSizector® 3D CameraBGA solder ball height measurement,
Chip coplanarity measurement,
SiP (System-in-Package) topography analysis.
Ultra-fast 0.14s/frame processing
Shadow-free measurement with multi-projection technology
50% increase in point cloud coverage
30% boost in accuracy
Typical use case
Performance metrics
-
More than 2D, better judgementHybrid Data CameraWafer AOI
Lead frame defect detection
IC surface marking recognition (OCR)
Extreme speed: 0.5s/pc
Concurrent 20+ algorithm models output
Supports efficient AI detection for defects and flaws, such as micro-cracks, stains, and scratches
Typical use case
Performance metrics